{ital In situ} detection of adsorbates at silica/solution interfaces by Fourier transform infrared attenuated total reflection spectroscopy using a silica-coated internal reflection element

Poston, P E; Rivera, D; Uibel, R; Harris, J M

doi:10.1366/0003702981943004

{ital In situ} detection of adsorbates at silica/solution interfaces by Fourier transform infrared attenuated total reflection spectroscopy using a silica-coated internal reflection element

Journal Article · Sat Oct 31 23:00:00 EST 1998 · Applied Spectroscopy

DOI:https://doi.org/10.1366/0003702981943004· OSTI ID:304225

Poston, P E; Rivera, D; Uibel, R; Harris, J M ^[1]

Department of Chemistry, University of Utah, Salt Lake City, Utah 84112 (United States)

A silica-coated ZnSe internal reflection element (IRE) was used to acquire attenuated total reflection (ATR) Fourier transform infrared (FT-IR) spectra of ethyl acetate at an {ital n}-heptane/silica surface. A thin silica film was deposited onto the IRE by withdrawing the substrate from a suspension of fumed silica; upon drying, a durable, porous SiO{sub 2} layer is formed on the IRE that is stable in contact with aprotic solvents. The layer thickness is targeted to be comparable to the depth of penetration of infrared radiation beyond the IRE/film interface. These films were used to investigate the adsorption of ethyl acetate onto silica from {ital n}-heptane. A multidimensional least-squares fit of the spectroscopic data reveals multiple surface-site energies on the silica surface, as reflected in both the solution concentration dependence of ethyl acetate accumulation on the surface and the frequencies of vibrational modes that shift upon adsorption. {copyright} {ital 1998} {ital Society for Applied Spectroscopy}

DOE Contract Number:: FG03-93ER14333

OSTI ID:: 304225

Journal Information:: Applied Spectroscopy, Journal Name: Applied Spectroscopy Journal Issue: 11 Vol. 52; ISSN 0003-7028; ISSN APSPA4

Country of Publication:: United States

Language:: English

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{ital In situ} detection of adsorbates at silica/solution interfaces by Fourier transform infrared attenuated total reflection spectroscopy using a silica-coated internal reflection element

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