Total dose test results for the 8086 microprocessor
Journal Article
·
· IEEE Trans. Nucl. Sci.; (United States)
The 8086 microprocessor has been characterized for total dose response. Commercial and militarystandard devices implemented in HMOS II technology as well as commercial devices implemented in HMOS technology were tested. Functional failures were observed between 6.8 krad(Si) and 25.9 kra(Si). The effect of fabrication technology and of variation in clock frequency is discussed. Functional failure modes as determined by test software are listed.
- Research Organization:
- Boeing Aerospace Co., P.O.B. 3999, Seattle, WA 98124
- OSTI ID:
- 6093160
- Journal Information:
- IEEE Trans. Nucl. Sci.; (United States), Journal Name: IEEE Trans. Nucl. Sci.; (United States) Vol. 29:6; ISSN IETNA
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
42 ENGINEERING
420800 -- Engineering-- Electronic Circuits & Devices-- (-1989)
440200* -- Radiation Effects on Instrument Components
Instruments
or Electronic Systems
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
COMPUTERS
DOSES
ELECTRONIC CIRCUITS
EQUIPMENT
FABRICATION
FAILURES
MICROELECTRONIC CIRCUITS
MICROPROCESSORS
PHYSICAL RADIATION EFFECTS
PROGRAMMING
RADIATION EFFECTS
TESTING
420800 -- Engineering-- Electronic Circuits & Devices-- (-1989)
440200* -- Radiation Effects on Instrument Components
Instruments
or Electronic Systems
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
COMPUTERS
DOSES
ELECTRONIC CIRCUITS
EQUIPMENT
FABRICATION
FAILURES
MICROELECTRONIC CIRCUITS
MICROPROCESSORS
PHYSICAL RADIATION EFFECTS
PROGRAMMING
RADIATION EFFECTS
TESTING