Hysteretic surface effects in multifilamentary NbTi wires exposed to transverse applied fields
Conference
·
· IEEE Transactions on Magnetics (Institute of Electrical and Electronics Engineers); (United States)
OSTI ID:6090120
- Battelle Memorial Inst., Columbus, OH (United States)
This paper reports on discrepancies in the magnetic hysteresis found between bare and clad samples of fine filamentary, multifilamentary, NbTi wires. This difference manifests itself as a greater hysteresis loss in bare as compared to clad filaments that is significant even in the transverse field orientation. These effects are investigated over a wide range of samples, and for various filament diameters. The dependence of these losses on the orientation of the field with respect to the filaments is studied as well. These effects are attributed to interface pinning.
- OSTI ID:
- 6090120
- Report Number(s):
- CONF-900944--
- Journal Information:
- IEEE Transactions on Magnetics (Institute of Electrical and Electronics Engineers); (United States), Journal Name: IEEE Transactions on Magnetics (Institute of Electrical and Electronics Engineers); (United States) Vol. 27:2; ISSN IEMGA; ISSN 0018-9464
- Country of Publication:
- United States
- Language:
- English
Similar Records
Magnetization decay effects in NbTi multifilamentary superconducting wires
Excess magnetization due to the presence of the matrix in a commercialized ultra fine multifilamentary NbTi composite with very fine filaments and Cu30%Ni matrix
Reduction of AC losses in ultra-fine multifilamentary NbTi wires
Conference
·
Thu Feb 28 23:00:00 EST 1991
· IEEE Transactions on Magnetics (Institute of Electrical and Electronics Engineers); (United States)
·
OSTI ID:5933846
Excess magnetization due to the presence of the matrix in a commercialized ultra fine multifilamentary NbTi composite with very fine filaments and Cu30%Ni matrix
Journal Article
·
Mon Jul 01 00:00:00 EDT 1996
· IEEE Transactions on Magnetics
·
OSTI ID:287629
Reduction of AC losses in ultra-fine multifilamentary NbTi wires
Conference
·
Tue Feb 28 23:00:00 EST 1989
· IEEE Trans. Magn.; (United States)
·
OSTI ID:6043299