Low frequency 1/ f noise measurements in YBa sub 2 Cu sub 3 O sub 7 thin films and the implications for HTS IR detectors

Conference · Fri Mar 01 04:00:00 EST 1991 · IEEE Transactions on Magnetics (Institute of Electrical and Electronics Engineers); (United States)

OSTI ID:6089306

Lacoe, R C; Hurrell, J P ^[1]; Springer, K; Raistrick, I D ^[2]; Hu, R; Burch, J F; Simon, R S ^[3]

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1. Aerospace Corp., El Segundo, CA (United States)
2. Los Alamos National Lab., NM (United States)
3. TRW Space and Technology Group, Redondo Beach, CA (US)

This paper reports on the low frequency noise voltage fluctuations measured on c-axis textured thin films of YBa{sub 2}Cu{sub 3}O{sup 7} on (100) SrTiO{sub 3} and on mixed a- and c-axis textured thin films of YBa{sub 2}Cu{sub 3}O{sub 7} on (100) LaAlO{sub 3}. In all cases, the power spectral density S{sub v}(f) {approximately} V{sup 2}/f{alpha}, where V is the average dc voltage across the film. Measurements on where V is the average dc voltage across the film. Measurements on structures of different surface areas indicates S{sub v}(f) is inversely proportional to the film surface area. From room temperature to above the superconducting transition temperature, S{sub v}(f)/V{sup 2} {approximately} T{sup 2}, while near the transition S{sub v}(f)/V{sup 2} level off before increasing sharply as the resistance goes to zero. The linear dependence of S{sub v}{sup 1/2}(f) on the bias current suggests that the noise arises from resistance fluctuations.

• OSTI ID: 6089306
• Report Number(s): CONF-900944--
• Conference Information: Journal Name: IEEE Transactions on Magnetics (Institute of Electrical and Electronics Engineers); (United States) Journal Volume: 27:2
• Country of Publication: United States
• Language: English

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