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Microstructure of epitaxial YBa sub 2 Cu sub 3 O sub 7 thin films

Conference ·
OSTI ID:6066643
Thin epitaxial films of YBa{sub 2}Cu{sub 3}O{sub 7} on single crystal substrates have been prepared in situ by laser ablation and by post situ annealing of evaporated films of Cu, Y and BaF{sub 2}. Substrates include (001) SrTiO{sub 3}, LaGaO{sub 3}, and LaAlO{sub 3}. For both in situ and post situ annealed films, epitaxial (001) grains of YBa{sub 2}Cu{sub 3}O{sub 7} form near the substrate but (100) and (010) grains tend to nucleate for thicknesses greater than {approximately}0.5{mu}m. 90{degree} grain boundaries are therefore common, as well as other defects such as small angle boundaries dislocations and stacking faults. High resolution electron microscopy of the substrate/superconductor interface shows regions of perfect epitaxy, distorted areas, amorphous regions and areas of interdiffusion. The relationship of observed microstructure to critical current density is discussed. 21 refs., 15 figs.
Research Organization:
Los Alamos National Lab., NM (USA)
Sponsoring Organization:
DOE; USDOE, Washington, DC (USA)
DOE Contract Number:
W-7405-ENG-36
OSTI ID:
6066643
Report Number(s):
LA-UR-91-887; CONF-901125--11; ON: DE91009951
Country of Publication:
United States
Language:
English