Microstructure of SrTiO{sub 3} thin films as single layer and incorporated in YBa{sub 2}Cu{sub 3}O{sub 7{minus}x}/SrTiO{sub 3} multilayers

Conference · Fri Nov 01 00:00:00 EST 1996

OSTI ID:392183

Ryen, L; Olsson, E ^[1]; Madsen, L D; Johnson, C N.L.; Wang, X; Jacobsen, S N; Helmersson, U ^[2]; Wernlund, L D ^[3]; Rudner, S ^[2]

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1. Chalmers Univ. of Technology, Goeteborg (Sweden). Dept. of Physics
2. Linkoeping Univ. (Sweden). Dept. of Physics
3. National Defence Research Establishment, Linkoeping (Sweden)

Epitaxial single layer (001) SrTiO{sub 3} films and an epitaxial YBa{sub 2}Cu{sub 3}O{sub 7{minus}x}/SrTiO{sub 3} multilayer were dc and rf sputtered on (110){sub rhombohedral} LaAlO{sub 3} substrates. The microstructure of the films was characterized using transmission electron microscopy. The single layer SrTiO{sub 3} films exhibited different columnar morphologies. The column boundaries were due to the lattice mismatch between film and substrate. The boundaries were associated with interfacial dislocations at the film/substrate interface, where the dislocations relaxed the strain in the a,b plane. The columns consisted of individual subgrains. These subgrains were misoriented with respect to each other, with different in-plane orientations and different tilts of the (001) planes. The subgrain boundaries were antiphase or tilt boundaries. The individual layers of the YBa{sub 2}Cu{sub 3}O{sub 7{minus}x}/SrTiO{sub 3} multilayer were relatively uniform. A distortion of the SrTiO{sub 3} unit cell of 0.9% in the [001] direction and a Sr/Ti ratio of 0.62 {+-} 0.04 was observed, both in correspondence with the single layer SrTiO{sub 3} films. Areas with different tilt of the (001)-planes were also present, within each individual SrTiO{sub 3} layer.

• OSTI ID: 392183
• Report Number(s): CONF-951155-; ISBN 1-55899-304-5; TRN: IM9647%%37
• Resource Relation: Conference: Fall meeting of the Materials Research Society (MRS), Boston, MA (United States), 27 Nov - 1 Dec 1995; Other Information: PBD: 1996; Related Information: Is Part Of Epitaxial oxide thin films 2; Speck, J.S. [ed.] [Univ. of California, Santa Barbara, CA (United States)]; Fork, D.K. [ed.] [Xerox Palo Alto Research Center, CA (United States)]; Wolf, R.M. [ed.] [Philips Research Labs., Briarcliff Manor, NY (United States)]; Shiosaki, Tadashi [ed.] [Kyoto Univ. (Japan)]; PB: 577 p.; Materials Research Society symposium proceedings, Volume 401
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
42 ENGINEERING NOT INCLUDED IN OTHER CATEGORIES
COMPOSITE MATERIALS
SPUTTERING
MICROSTRUCTURE
STRONTIUM OXIDES
TITANIUM OXIDES
YTTRIUM OXIDES
BARIUM OXIDES
COPPER OXIDES
MICROWAVE EQUIPMENT
SUBSTRATES
LANTHANUM COMPOUNDS
ALUMINATES
TRANSMISSION ELECTRON MICROSCOPY
X-RAY SPECTROSCOPY
MORPHOLOGY
INTERFACES
DISLOCATIONS
ORIENTATION
STRAINS
LATTICE PARAMETERS