Microstructure of SrTiO{sub 3} thin films as single layer and incorporated in YBa{sub 2}Cu{sub 3}O{sub 7{minus}x}/SrTiO{sub 3} multilayers

Conference · Fri Nov 01 04:00:00 EST 1996

OSTI ID:392183

Ryen, L; Olsson, E ^[1]; Madsen, L D; Johnson, C N.L.; Wang, X; Jacobsen, S N; Helmersson, U ^[2]; Wernlund, L D ^[3]; Rudner, S ^[2]

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1. Chalmers Univ. of Technology, Goeteborg (Sweden). Dept. of Physics
2. Linkoeping Univ. (Sweden). Dept. of Physics
3. National Defence Research Establishment, Linkoeping (Sweden)

Epitaxial single layer (001) SrTiO{sub 3} films and an epitaxial YBa{sub 2}Cu{sub 3}O{sub 7{minus}x}/SrTiO{sub 3} multilayer were dc and rf sputtered on (110){sub rhombohedral} LaAlO{sub 3} substrates. The microstructure of the films was characterized using transmission electron microscopy. The single layer SrTiO{sub 3} films exhibited different columnar morphologies. The column boundaries were due to the lattice mismatch between film and substrate. The boundaries were associated with interfacial dislocations at the film/substrate interface, where the dislocations relaxed the strain in the a,b plane. The columns consisted of individual subgrains. These subgrains were misoriented with respect to each other, with different in-plane orientations and different tilts of the (001) planes. The subgrain boundaries were antiphase or tilt boundaries. The individual layers of the YBa{sub 2}Cu{sub 3}O{sub 7{minus}x}/SrTiO{sub 3} multilayer were relatively uniform. A distortion of the SrTiO{sub 3} unit cell of 0.9% in the [001] direction and a Sr/Ti ratio of 0.62 {+-} 0.04 was observed, both in correspondence with the single layer SrTiO{sub 3} films. Areas with different tilt of the (001)-planes were also present, within each individual SrTiO{sub 3} layer.

• OSTI ID: 392183
• Report Number(s): CONF-951155--; ISBN 1-55899-304-5
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
42 ENGINEERING
ALUMINATES
BARIUM OXIDES
COMPOSITE MATERIALS
COPPER OXIDES
DISLOCATIONS
INTERFACES
LANTHANUM COMPOUNDS
LATTICE PARAMETERS
MICROSTRUCTURE
MICROWAVE EQUIPMENT
MORPHOLOGY
ORIENTATION
SPUTTERING
STRAINS
STRONTIUM OXIDES
SUBSTRATES
TITANIUM OXIDES
TRANSMISSION ELECTRON MICROSCOPY
X-RAY SPECTROSCOPY
YTTRIUM OXIDES