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Thermally induced resistive domains in thin superconducting indium films

Journal Article · · Sov. Phys. - JETP (Engl. Transl.); (United States)
OSTI ID:6062597

A phenomenological theory describing localized resistive regions in superconducting thin films is used to introduce the concept of elementary resistive domains which are analogs of phase slip centers characteristic of superconducting thin channels and microbridges. The main feature of elementary resistive domains is the same as that of phase slip centers: energy dissipatation in the domains occurs in a region of width 2l/sub E/, where l/sub E/ is the depth of penetration of a longitudinal electric field into the superconductor. It is shown that the number of jumps in the current-voltage characteristic of a film with a domain, recorded under constant-current conditions, is a function of the parameters of the film and is independent of the thermostat temperature. An estimate of l/sub E/ is obtained using the experimental current-voltage characteristics of elementary domains and allowing for the inhomogeneous distribution of the current across the film width. Experiments are reported in which resistive domains (including elementary ones) are induced by heaters in the form of evaporated copper films. Characteristic features of domains formed in the presence of a heater include a wide range of currents in which such domains exist, and their disappearance on switching off the heater if the value of the transport current does not exceed a certain critical value, the threshold nature of the excitation at low rates of heat flow, etc. The mechanism of formation of these superdomains is explained schematically and experiments are considered for the separate determination of the currents responsible for the appearance of domains.

Research Organization:
Physicotechnical Institute, Academy of Sciences of the Ukrainian SSR, Donetsk
OSTI ID:
6062597
Journal Information:
Sov. Phys. - JETP (Engl. Transl.); (United States), Journal Name: Sov. Phys. - JETP (Engl. Transl.); (United States) Vol. 56:2; ISSN SPHJA
Country of Publication:
United States
Language:
English

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