Current-induced destruction of superconductivity in wide films

Journal Article · Sat Feb 28 23:00:00 EST 1981 · Sov. J. Low Temp. Phys. (Engl. Transl.); (United States)

OSTI ID:5890172

Volotskaya, V; Dmitrenko, I; Musienko, L; Sivakov, A

Features of the current-voltage characteristics of thin Sn and Al films have been investigated in a wide interval of film widths w>>lambda/sub perpendicular/. It is shown that the steplike structure of the current-voltage characteristics of wide films is similar to those of narrow superconducting channels with phase slip centers. A qualitative model is proposed to explain the appearance of such features in wide films.

• Research Organization: Physicotechnical Institute of Low Temperatures, Academy of Sciences of the Ukrainian SSR, Khar'kov
• OSTI ID: 5890172
• Journal Information: Sov. J. Low Temp. Phys. (Engl. Transl.); (United States), Journal Name: Sov. J. Low Temp. Phys. (Engl. Transl.); (United States) Vol. 7:3; ISSN SJLPD
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
360104* -- Metals & Alloys-- Physical Properties
656102 -- Solid State Physics-- Superconductivity-- Acoustic
Electronic
Magnetic
Optical
& Thermal Phenomena-- (-1987)
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
ALUMINIUM
DIMENSIONS
ELECTRIC CONDUCTIVITY
ELECTRICAL PROPERTIES
ELEMENTS
FILMS
MATHEMATICAL MODELS
METALS
PHYSICAL PROPERTIES
SUPERCONDUCTING FILMS
SUPERCONDUCTIVITY
THICKNESS
TIN