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Title: Analysis of the photo voltage decay (PVD) method for measuring minority carrier lifetimes in P-N junction solar cells

Journal Article · · J. Appl. Phys.; (United States)
DOI:https://doi.org/10.1063/1.329478· OSTI ID:6051479

When the diffusion length of minority carriers becomes comparable or even larger than the thickness of a P-N junction solar cell, the characteristic decay of the photogenerated voltage becomes a mixture of contributions with different time constants. The minority carrier recombination lifetime tau and the time constant l/sup 2//D, where l is essentially the thickness of the cell and D the minority carrier diffusion length, determine the signal as a function of time. It is shown that for ordinary solar cells (N/sup +/-P junctions), particularly when the diffusion length L of the minority carriers is larger than the cell thickness l, the excess carrier density decays according to exp(-t/tau-..pi../sup 2/Dt/4l/sup 2/), tau being the lifetime. Therefore, tau can be readily determined by the photo voltage decay (PVD) method once D and l are known. For ideal back-surface-field (BSF) cells (N/sup +/-P-P/sup +/ junctions) under the same circumstances the excess number density of carriers decays purely exponentially as exp(-t/tau). However most BSF solar cells are not ideal, possessing an effective surface recombination velocity s/sub eff/ of 100 to 1000 cm/sec at the high-low junction. Therefore, PVD measurements for BSF cells must be treated with caution and must be supplemented with other nonstationary methods recently developed. These facts are important for a determination of diffusion lengths since steady-state methods are notoriously unreliable when the cell thickness is smaller than the diffusion length. Finally a connection will be made with older work on the same subject.

Research Organization:
Jet Propulsion Laboratory, California Institute of Technology, Pasadena, California
OSTI ID:
6051479
Journal Information:
J. Appl. Phys.; (United States), Vol. 52:9
Country of Publication:
United States
Language:
English