Probability of detection of internal voids in structural ceramics using microfocus radiography

Technical Report · Fri Nov 01 00:00:00 EST 1985

OSTI ID:6048680

Baaklini, G Y; Roth, D J

The reliability of microfocus x-radiography for detecting subsurface voids in structural ceramic test specimens was statistically evaluated. The microfocus system was operated in the projection mode using low x-ray photon energies (20 keV) and a 10 micro m focal spot. The statistics were developed for implanted subsurface voids in green and sintered silicon carbide and silicon nitride test specimens. These statistics were compared with previously-obtained statistics for implanted surface voids in similar specimens. Problems associated with void implantation are discussed. Statistical results are given as probability-of-detection curves at a 95 percent confidence level for voids ranging in size from 20 to 528 micro m in diameter.

• Research Organization: National Aeronautics and Space Administration, Cleveland, OH (USA). Lewis Research Center
• OSTI ID: 6048680
• Report Number(s): N-86-13749
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
MICRORADIOGRAPHY
RELIABILITY
SILICON CARBIDES
INDUSTRIAL RADIOGRAPHY
VOIDS
SILICON NITRIDES
EXPERIMENTAL DATA
SENSITIVITY
CARBIDES
CARBON COMPOUNDS
DATA
INFORMATION
NITRIDES
NITROGEN COMPOUNDS
NUMERICAL DATA
PNICTIDES
SILICON COMPOUNDS
360202* - Ceramics
Cermets
& Refractories- Structure & Phase Studies