Skip to main content
U.S. Department of Energy
Office of Scientific and Technical Information

Masks for high aspect ratio x-ray lithography

Technical Report ·
DOI:https://doi.org/10.2172/603703· OSTI ID:603703
;  [1]; ;  [2]
  1. Lawrence Berkeley National Lab., CA (United States)
  2. Sandia National Labs., Albuquerque, NM (United States)

Fabrication of very high aspect ratio microstructures, as well as ultra-high precision manufacturing is of increasing interest in a multitude of applications. Fields as diverse as micromechanics, robotics, integrated optics, and sensors benefit from this technology. The scale-length of this spatial regime is between what can be achieved using classical machine tool operations and that which is used in microelectronics. This requires new manufacturing techniques, such as the LIGA process, which combines x-ray lithography, electroforming, and plastic molding.

Research Organization:
Lawrence Berkeley Lab., CA (United States)
DOE Contract Number:
AC03-76SF00098
OSTI ID:
603703
Report Number(s):
LBNL--39981; ON: DE97007345
Country of Publication:
United States
Language:
English

Similar Records

Deep-etch x-ray lithography at the ALS: First results
Technical Report · Mon Mar 31 23:00:00 EST 1997 · OSTI ID:603689

Planar silicon fabrication process for high-aspect-ratio micromachined parts
Technical Report · Mon Sep 01 00:00:00 EDT 1997 · OSTI ID:537377

Deep etch x-ray lithography at the advanced light source: First results
Journal Article · Mon Oct 31 23:00:00 EST 1994 · Journal of Vacuum Science and Technology. B, Microelectronics Processing and Phenomena; (United States) · OSTI ID:6847377