skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Observation of higher order parametric x-ray spectra in mosaic graphite and single silicon crystals

Journal Article · · Physical Review Letters; (United States)
; ; ; ; ; ; ; ; ;  [1]
  1. Research and Technology Department, Naval Surface Warfare Center, Silver Spring, Maryland 20903 (United States) Department of Physics, Naval Postgraduate School, Monterey, California 93943 (United States) Adelphi Technology Inc., Palo Alto, California 94301 (United States)

We have observed up to 8 orders ([ital n]) in the spectra of parametric x-radiation (PXR) in the range 5--40 keV, produced by the interaction of a 90 MeV electron beam with mosaic graphite and single silicon crystals. The measured yields and intensity ratios, [ital I]([ital n][ge]2)/[ital I]([ital n]=1), in graphite are not in agreement with the theory of PXR for mosaic crystals. In comparison, the ratios of intensities in silicon are close to the predictions of PXR theory for perfect crystals. The bandwidths of spectral lines measured in both silicon and graphite are in good agreement with theoretical predictions.

DOE Contract Number:
FG03-91ER81099
OSTI ID:
6023158
Journal Information:
Physical Review Letters; (United States), Vol. 71:5; ISSN 0031-9007
Country of Publication:
United States
Language:
English