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Surface chemistry of Cu/sub x/S and Cu/sub x/S/CdS determined from x-ray photoelectron spectroscopy

Journal Article · · J. Appl. Phys.; (United States)
DOI:https://doi.org/10.1063/1.335283· OSTI ID:6009166
X-ray photoelectron spectroscopy spectra measured on copper sulfide (Cu/sub x/S) films showed that a thin surface reaction product containing Cu in the +2 valence state was formed on Cu/sub x/S films exposed to air for 46 h at 40 /sup 0/C and 90% relative humidity. An entirely different Cu/sub x/S surface reaction product layer was formed in dry air at 170 /sup 0/C for 30 min and it contained sulfur in the +6 valence state. The copper (Cu) valence state in Cu/sub x/S was not found to be +2 even when the x value was less than 1.9. When the argon sputter-cleaned surface of Cu/sub x/S or Cu/sub x/S/CdS films was exposed to room-temperature air for 10 min, cadmium (Cd) atoms appeared on the Cu/sub x/S surface. X-ray powder diffraction patterns showed that CuO and CdS reacted at 500 /sup 0/C in flowing nitrogen to form Cu/sub 2/S and CdO. This cation exchange between CdS and copper oxide may explain the surface Cd on the Cu/sub x/S films. The standard free energy of reaction between CuO and CdS is positive while that between Cu/sub 2/O and CdS is negative. These results indicate a method for stabilizing Cu/sub x/S/CdS solar cells against degradation.
Research Organization:
Chevron Research Company, Richmond, California 94802-0627
OSTI ID:
6009166
Journal Information:
J. Appl. Phys.; (United States), Journal Name: J. Appl. Phys.; (United States) Vol. 57:11; ISSN JAPIA
Country of Publication:
United States
Language:
English