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X-ray and XPS studies of evaporated Cu/sub x/S thin films

Journal Article · · J. Vac. Sci. Technol., A; (United States)
DOI:https://doi.org/10.1116/1.571908· OSTI ID:5865732
The structural changes in Cu/sub x/S films have been monitored by x-ray diffraction and correlated to the chemical changes taking place on the Cu/sub x/S surface, the latter monitored by XPS. The results show: evaporated Cu/sub x/S films contained chalcocite, free copper phases, and probably a third phase (of sulfur); resistivity is related to the amounts of free Cu and S in the film; air heat treatments converted chalcocite to Cu deficient phases and resulted in the disappearance of the sulfide and predominance of CuSO/sub 4/xnH/sub 2/O and CuO; argon heat treatment tended to react Cu and S to form Cu/sub x/S; Cd is detected on the surface of Cu/sub x/S deposited onto CdS and is significantly increased in amount by heat treatments. These results can be related to chemical processes occurring on Cu/sub x/S/CdS and Cu/sub x/S/(Zn,Cd)S solar cells. For the CdS cell, oxides and sulfates of Cu and Cd are found on the Cu/sub x/S surface and the sulfates are enhanced by the heat treatment in moist air. CuO and CuSO/sub 4/ are formed in the absence of Cd, and dominate the Cu/sub x/S surface.
Research Organization:
Departments of Electrical and Materials Engineering, Virginia Polytechnic Institute and State University, Blacksburg, Virginia 24061
OSTI ID:
5865732
Journal Information:
J. Vac. Sci. Technol., A; (United States), Journal Name: J. Vac. Sci. Technol., A; (United States) Vol. 1:2; ISSN JVTAD
Country of Publication:
United States
Language:
English