Scaling characteristics of ultrasmall Josephson junctions

Journal Article · Tue Dec 15 04:00:00 EST 1981 · Appl. Phys. Lett.; (United States)

DOI:https://doi.org/10.1063/1.92639· OSTI ID:6005346

Rogovin, D; Nagel, J

Recent advances in the technology of ultrasmall Josephson junctions focus interest on the scaling characteristics of these devices. We examine the size dependence of the pair current, the rms noise current as well as the voltage fluctuations of ultrasmall junctions, and find novel scaling behavior. Among other things, the low-temperature zero voltage, dc pair current depends on the cube of the junction area.

• Research Organization: Science Applications, Incorporation, 1200 Prospect Street, La Jolla, California 92037
• OSTI ID: 6005346
• Journal Information: Appl. Phys. Lett.; (United States), Journal Name: Appl. Phys. Lett.; (United States) Vol. 39:12; ISSN APPLA
• Country of Publication: United States
• Language: English

Related Subjects

420201* -- Engineering-- Cryogenic Equipment & Devices
71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
CURRENTS
DATA
DIRECT CURRENT
ELECTRIC CURRENTS
EQUATIONS
INFORMATION
JOSEPHSON JUNCTIONS
JUNCTIONS
MATHEMATICAL MODELS
NOISE
NUMERICAL DATA
SCALING LAWS
SUPERCONDUCTING JUNCTIONS
THEORETICAL DATA
VARIATIONS