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Electrical overstress/electrostatic discharge symposium proceedings. 1986

Conference ·
OSTI ID:5995723

This book contains 35 selections. Some of the titles are: Phenomenology of pulse failure thresholds in a small signal diode; Latent failures due to electrostatic discharge in CMOS integrated circuits; Studies and revelation of latent ESD failures; Computer simulation of ESD and lightning events; and Thick oxide device ESD performance under process variations.

OSTI ID:
5995723
Report Number(s):
CONF-8609149-
Country of Publication:
United States
Language:
English

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Related Subjects

42 ENGINEERING
420800* -- Engineering-- Electronic Circuits & Devices-- (-1989)
99 GENERAL AND MISCELLANEOUS
990220 -- Computers
Computerized Models
& Computer Programs-- (1987-1989)
ABSTRACTS
CHALCOGENIDES
COMPUTERIZED SIMULATION
DOCUMENT TYPES
ELECTRIC DISCHARGES
ELECTRONIC CIRCUITS
ELECTROSTATICS
FAILURE MODE ANALYSIS
INTEGRATED CIRCUITS
LEADING ABSTRACT
LIGHTNING
MICROELECTRONIC CIRCUITS
OXIDES
OXYGEN COMPOUNDS
PULSES
SEMICONDUCTOR DEVICES
SEMICONDUCTOR DIODES
SIMULATION
SYSTEM FAILURE ANALYSIS
SYSTEMS ANALYSIS