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Chemical model for wire chamber aging in CF[sub 4]/[ital i]C[sub 4]H[sub 10] gases

Journal Article · · Journal of Applied Physics; (United States)
DOI:https://doi.org/10.1063/1.354234· OSTI ID:5978760
;  [1];  [2]
  1. Lawrence Berkeley Laboratory, University of California, Berkeley, California 94720 (United States)
  2. Department of Chemical Engineering, Lehigh University, Bethlehem, Pennsylvania 18015 (United States)

Aging of proportional counters in CF[sub 4]/[ital i]C[sub 4]H[sub 10] mixtures is studied as a function of gas composition. Anode surfaces are analyzed by Auger electron spectroscopy. Anode-wire deposits are formed from 95/5 and 90/10 mixtures of CF[sub 4]/[ital i]C[sub 4]H[sub 10]; etching of deposits occurs in 50/50 and 80/20 mixtures of CF[sub 4]/[ital i]C[sub 4]H[sub 10] and in pure CF[sub 4]. Gold-plated wires are resistant to aging resulting from chemical attack by CF[sub 4], but non-gold-plated wires are too reactive for use in CF[sub 4]-containing gases. An apparent cathode aging process resulting in loss of gain rather than in a self-sustained discharge current is observed in CF[sub 4] and CF[sub 4]-rich gases. Principles of low-pressure rf plasma chemistry are used to interpret the plasma chemistry in avalanches ([ge]1 atm, dc). To understand anode aging in CF[sub 4]/[ital i]C[sub 4]H[sub 10] gases, a four-part model is developed considering: (i) plasma polymerization of [ital i]C[sub 4]H[sub 10]; (ii) etching of wire deposits by CF[sub 4]; (iii) deposition that occurs as a result of radical scavenging in strongly etching environments; and (iv) reactivity of the wire surface. Practical guidelines suggested by the model and application of the model to other fluorine-containing gases are discussed.

DOE Contract Number:
AC03-76SF00098
OSTI ID:
5978760
Journal Information:
Journal of Applied Physics; (United States), Journal Name: Journal of Applied Physics; (United States) Vol. 74:9; ISSN JAPIAU; ISSN 0021-8979
Country of Publication:
United States
Language:
English