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X-ray diffraction investigation of solid solutions based on SnTe in the Sn-Bi-Te system

Journal Article · · Inorg. Mater. (Engl. Transl.); (United States)
OSTI ID:5972823
An earlier comparison of the results of x-ray diffraction investigations of solid solutions based on SnTe in the Sn-Sb-Te system and theoretical calculations made it possible to conclude that a chemical interaction takes place in these solid solutions and results in the formation of complexes of the Sb/sub 2/Te/sub 3/ type. In the case of compositions corresponding to the formation of the maximum possible number of complexes, discontinuities were discovered on plots of the concentration dependence of the unit cell. The purpose of this work was to carry out similar investigations in the Sn-Bi-Te system. The compositions of the alloys synthesized corresponded to the isoconcentration lines for 1 and 2 at. % Bi at Te concentrations from 50.0 to 51.3 at. %. In contrast to the Sn-Sb-Te system, no discontinuities are observed on the plots of the concentration dependence of the unit-cell parameter /alpha/ along the isoconcentration lines of Bi. Theoretical calculations of the concentration dependence of /alpha/ were performed for two models of the solid solutions. A portion of the solubility isotherm at 820 K was constructed on the basis of the results of the x-ray diffraction investigation. As more Bi is introduced, the boundaries of the homogeneity region of SnTe are displaced toward an increase in the content of Te.
Research Organization:
V.I. Lenin Kharkov Polytechnic (USSR)
OSTI ID:
5972823
Journal Information:
Inorg. Mater. (Engl. Transl.); (United States), Journal Name: Inorg. Mater. (Engl. Transl.); (United States) Vol. 24:7; ISSN INOMA
Country of Publication:
United States
Language:
English