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Characterization of optical coatings with backscattering spectrometry

Journal Article · · Appl. Opt.; (United States)
DOI:https://doi.org/10.1364/AO.28.002762· OSTI ID:5972552

We present three examples to illustrate the use of backscattering spectrometry to determine film stoichiometry, areal density, and impurity levels in optical coatings. Helium-ion beams with energies in the 1.5--5.0-MeV range were used to analyze (1) a magnesium fluoride coating, (2) a tungsten/silicon multilayer soft x-ray mirror, and (3) a trilayer optical data storage film.

Research Organization:
University of Arizona, Physics Department, Tucson, Arizona 85721(US)
OSTI ID:
5972552
Journal Information:
Appl. Opt.; (United States), Journal Name: Appl. Opt.; (United States) Vol. 28:14; ISSN APOPA
Country of Publication:
United States
Language:
English