Observation of magnetic dead layers at the surface of iron oxide films
Journal Article
·
· Appl. Phys. Lett.; (United States)
Depth profiles of the magnetization of sputtered films of Fe/sub 3/O/sub 4/ and its oxidized form, ..gamma..-Fe/sub 2/O/sub 3/, were obtained by the new polarized neutron reflection technique. We find that the magnetization of Fe/sub 3/O/sub 4/ is constant throughout the thickness (2600 A) of the film except for a surface region about 25 A deep corresponding to the surface roughness. In contrast the oxidized sample shows a magnetically dead layer approx.150 A thick at the surface. X-ray and transmission electron microscopy studies give no evidence that the surface layers differ structurally from the bulk of the film, although there is the possibility of a highly defective surface region formed during the oxidation process.
- Research Organization:
- IBM Almaden Research Center, San Jose, California 95120-6099
- DOE Contract Number:
- W-31109-ENG-38
- OSTI ID:
- 5954604
- Journal Information:
- Appl. Phys. Lett.; (United States), Journal Name: Appl. Phys. Lett.; (United States) Vol. 48:9; ISSN APPLA
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
36 MATERIALS SCIENCE
360204* -- Ceramics
Cermets
& Refractories-- Physical Properties
CHALCOGENIDES
CHEMICAL REACTIONS
COERCIVE FORCE
COHERENT SCATTERING
CRYSTAL STRUCTURE
DATA
DIFFRACTION
DIMENSIONS
ELECTRON MICROSCOPY
EXPERIMENTAL DATA
FILMS
INFORMATION
IRON COMPOUNDS
IRON OXIDES
LAYERS
MAGNETIZATION
MICROSCOPY
NEUTRON DIFFRACTION
NUMERICAL DATA
OXIDATION
OXIDES
OXYGEN COMPOUNDS
SCATTERING
SURFACE PROPERTIES
SURFACES
THICKNESS
TRANSITION ELEMENT COMPOUNDS
TRANSMISSION ELECTRON MICROSCOPY
X-RAY DIFFRACTION
360204* -- Ceramics
Cermets
& Refractories-- Physical Properties
CHALCOGENIDES
CHEMICAL REACTIONS
COERCIVE FORCE
COHERENT SCATTERING
CRYSTAL STRUCTURE
DATA
DIFFRACTION
DIMENSIONS
ELECTRON MICROSCOPY
EXPERIMENTAL DATA
FILMS
INFORMATION
IRON COMPOUNDS
IRON OXIDES
LAYERS
MAGNETIZATION
MICROSCOPY
NEUTRON DIFFRACTION
NUMERICAL DATA
OXIDATION
OXIDES
OXYGEN COMPOUNDS
SCATTERING
SURFACE PROPERTIES
SURFACES
THICKNESS
TRANSITION ELEMENT COMPOUNDS
TRANSMISSION ELECTRON MICROSCOPY
X-RAY DIFFRACTION