X-ray fluorescence analysis
A sample is analyzed for the presence of an element by exposing it to radiation which causes the element to emit a characteristic radiation. Background radiation and the characteristic radiation are passed through a first filter which attenuates the characteristic radiation. The time required for a fixed amount of radiation to pass through the first filter is measured to establish a reference time. Radiation from the sample is then passed through a second filter which attenuates the characteristic radiation by an amount different from the first filter. The amount of radiation passing through the second filter is measured during a time interval substantially equal to the reference time. The difference between the two amounts of radiation indicates the amount of element in the sample and reduces errors due to samples of different composition and physical condition and due to variation of radiation intensity from the source.
- Assignee:
- Associated Metals and Minerals Corp
- Patent Number(s):
- US 4283625
- OSTI ID:
- 5950545
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
400103* -- Radiometric & Radiochemical Procedures-- (-1987)
CHEMICAL ANALYSIS
FILTERS
MEASURING INSTRUMENTS
NONDESTRUCTIVE ANALYSIS
RADIATION ABSORPTION ANALYSIS
RADIATION DETECTORS
TIME MEASUREMENT
X-RAY EMISSION ANALYSIS
X-RAY FLUORESCENCE ANALYSIS