Method and apparatus for the measurement of X-ray sources
This patent describes an apparatus for the measurement of the characteristics of an X-ray beam from an X-ray machine comprising: (a) first detector unit means for providing an output signal related to the intensity of the X-ray radiation incident on it which passes through an X-ray filter of a first attenuation characteristic; (b) second detector unit means for providing an output signal related to intensity of the X-ray radiation incident on it which passes through an X-ray filter of a second attenuation characteristic different than that of the X-ray filter for the first detector unit means; (c) first integrator means for integrating the signal from the first detector means and providing an output signal indicative thereof; (d) second integrator means for integrating the signal from the second detector means and providing an output signal indicative thereof; (e) conversion means for determining the ratio of the integrated first detector signal and the integrated second detector signal and providing a multi-bit digital output signal on parallel lines; (f) memory means for providing an output of data stored at an address location corresponding to the multi-bit input signal on the address lines such that the output data from the memory means is indicative of a selected characteristic of the X-ray beam received by the first and second detector unit means; (g) display means for receiving the output data signal from the memory means and for providing a display to an operator which corresponds to the data from the memory means; and (h) timing and control means for determining when the magnitude of the output signal of the first integrator means exceeds a predetermined level and thereafter holding the output signal levels of the first and second integrator means constant to allow such levels to be readily compared by the conversion means to determine a ratio output signal which remains substantially constant.
- Assignee:
- Wisconsin Alumni Research Foundation, Madison, WI
- Patent Number(s):
- US 4697280
- OSTI ID:
- 5812822
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
99 GENERAL AND MISCELLANEOUS
990220 -- Computers
Computerized Models
& Computer Programs-- (1987-1989)
ATTENUATION
CONTROL SYSTEMS
DATA PROCESSING
DETECTION
DIGITAL SYSTEMS
DISPLAY DEVICES
ELECTROMAGNETIC RADIATION
EQUIPMENT
IONIZING RADIATIONS
MEASURING INSTRUMENTS
MEASURING METHODS
MEMORY DEVICES
PROCESSING
RADIATION DETECTION
RADIATION DETECTORS
RADIATION SOURCES
RADIATIONS
SIGNAL CONDITIONING
SIGNALS
X RADIATION
X-RAY DETECTION
X-RAY EQUIPMENT
X-RAY SOURCES