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Experiments and modeling of the photocurrent response of GaAs MESFETs

Conference · · IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (USA)
OSTI ID:5933512
; ; ;  [1];  [2]; ;  [3]
  1. Rensselaer Polytechnic Inst., Troy, NY (USA). Dept. of Nuclear Engineering
  2. Rensselaer Polytechnic Inst., Troy, NY (USA). Dept. of Electrical, Computer, and Systems Engineering
  3. Grumman Corp., Bethpage, NY (USA). Corporate Research Center

One micron technology GaAs MESFETs have been exposed to a transient radiation environment at a linear accelerator laboratory and modeled by computer simulation using a modified version of the PISCES-IIB semiconductor device simulation code and the TRIGSPICE circuit simulation code. The MESFETs were tested in steady-state conditions, with short (20 ns) radiation pulses, and with short pulses on devices that had received a prior dose of gamma, neutron or neutron-plus-gamma irradiation. Parasitic bipolar action was observed in the short pulse testing in unexposed devices. Previously unreported transient failure was observed in the neutron pre-irradiated devices only. The threshold for this failure was consistent with the level of severity of prior irradiation. Steady-state photocurrent and the parasitic bipolar transistor are modeled and explained on the basis of physical mechanisms.

OSTI ID:
5933512
Report Number(s):
CONF-900723--
Journal Information:
IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (USA), Journal Name: IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (USA) Vol. 37:6; ISSN 0018-9499; ISSN IETNA
Country of Publication:
United States
Language:
English

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