Formation and microstructure of Mg-Si-O-N glasses

Journal Article · Mon Oct 01 00:00:00 EDT 1984 · J. Am. Ceram. Soc.; (United States)

DOI:https://doi.org/10.1111/j.1151-2916.1984.tb19674.x· OSTI ID:5918347

Shaw, T M; Loehman, R E; Thomas, G

Bulk oxynitride glasses in the Mg-Si-O-N system were prepared by melting mixtures of SiO/sub 2/, MgO, and Si/sub 3/N/sub 4/ powders and the microstructures and compositions of the glasses were analyzed by electron microscopy, energy and wavelength dispersive X-ray analysis, and energy loss spectrometry. The melting experiments indicate the presence of a limited glassforming region in the system. For the melting conditions used, nitrogen was found to be a necessary constituent of the melts to prevent crystallization on cooling. Extension of the miscibility gap in the binary MgO-SiO/sub 2/ system into the Mg-Si-O-N system results in phase separation in most of the glasses. A partial plot of the miscibility gap in the Mg-Si-O-N system is established from analysis of the composition of the phases formed during phase separation of the glasses.

• Research Organization: IBM, Thomas J. Watson Research Center, Yorktown Heights, New York
• OSTI ID: 5918347
• Journal Information: J. Am. Ceram. Soc.; (United States), Journal Name: J. Am. Ceram. Soc.; (United States) Vol. 67:10; ISSN JACTA
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
360601* -- Other Materials-- Preparation & Manufacture
ALKALINE EARTH METAL COMPOUNDS
ALKALINE EARTH METALS
CHALCOGENIDES
CHEMICAL ANALYSIS
CHEMICAL COMPOSITION
CHEMICAL PREPARATION
CRYSTAL STRUCTURE
CRYSTAL-PHASE TRANSFORMATIONS
CRYSTALLOGRAPHY
ELECTRON MICROSCOPY
ELECTRON SPECTROSCOPY
ELEMENTS
ENERGY-LOSS SPECTROSCOPY
GLASS
MAGNESIUM
MAGNESIUM COMPOUNDS
MAGNESIUM OXIDES
MELTING
METALS
MICROSCOPY
MICROSTRUCTURE
NITRIDES
NITROGEN
NITROGEN COMPOUNDS
NONDESTRUCTIVE ANALYSIS
NONMETALS
OXIDES
OXYGEN
OXYGEN COMPOUNDS
PHASE TRANSFORMATIONS
PNICTIDES
POWDERS
SEMIMETALS
SILICON
SILICON COMPOUNDS
SILICON NITRIDES
SILICON OXIDES
SPECTROSCOPY
SYNTHESIS
X-RAY EMISSION ANALYSIS