Low-energy electron diffraction and photoemission study of epitaxial films of Cu on Ag l brace 001 r brace

Journal Article · Fri Mar 15 04:00:00 EST 1991 · Physical Review, B: Condensed Matter; (USA)

DOI:https://doi.org/10.1103/PhysRevB.43.6342· OSTI ID:5889748

Li, H; Tian, D; Quinn, J; Li, Y S; Jona, F ^[1]; Marcus, P M ^[2]

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1. College of Engineering and Applied Science, State University of New York, Stony Brook, New York 11794 (US)
2. IBM Research Center, P.O. Box 218, Yorktown Heights, New York 10598 (USA)

The epitaxy of Cu on Ag{l brace}001{r brace} is studied by qualitative and quantitative low-energy electron diffraction (LEED) and by angle-resolved photoemission. LEED indicates that ultrathin (two- to three-atomic-layer) films have a limited amount of long-range order, and the ordered component has interlayer spacings of 1.45{plus minus}0.06 A, which compares well with the theoretically determined cubic lattice constant 2.87{plus minus}0.06 A of a metastable body-centered-cubic (bcc) modification of Cu. Thicker (10- to 12-layer) films have almost no long-range order, and photoemission indicates that regions of bcc and fcc Cu coexist amid large amounts of defects.

• DOE Contract Number: FG02-86ER45239
• OSTI ID: 5889748
• Journal Information: Physical Review, B: Condensed Matter; (USA), Journal Name: Physical Review, B: Condensed Matter; (USA) Vol. 43:8; ISSN 0163-1829; ISSN PRBMD
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
360102* -- Metals & Alloys-- Structure & Phase Studies
COHERENT SCATTERING
COPPER
CRYSTAL DEFECTS
CRYSTAL STRUCTURE
DIFFRACTION
DIMENSIONS
ELECTRON DIFFRACTION
ELEMENTS
EMISSION
EPITAXY
FILMS
LATTICE PARAMETERS
METALS
PHOTOEMISSION
SCATTERING
SECONDARY EMISSION
SILVER
THICKNESS
TRANSITION ELEMENTS