Skip to main content
U.S. Department of Energy
Office of Scientific and Technical Information

Error bounds for general describing function problems

Journal Article · · IEEE Trans. Circuits Syst.; (United States)
The describing function method is widely used without much attention being paid to the error analysis so vital in any approximate method. One reason for this is the lack of a straightforward user-oriented method for checking error bounds except when the nonlinear element characteristic is single valued and of bounded slope. This paper attempts to eliminate that defect. A far wider range of nonlinear elements is now amenable to straightforward, usually graphical treatment; discontinuities, hysteresis, and backlash characteristics are included. In addition, previous results for slope-bounded single-valued nonlinear characteristics may be substantially improved with a small additional computational effort.
DOE Contract Number:
AC01-79ET29364
OSTI ID:
5879234
Journal Information:
IEEE Trans. Circuits Syst.; (United States), Journal Name: IEEE Trans. Circuits Syst.; (United States) Vol. CAS-29:6; ISSN ICSYB
Country of Publication:
United States
Language:
English

Similar Records

Two Error Bounds for Constrained Optimization Problems and Their Applications
Journal Article · Sun Jun 15 00:00:00 EDT 2008 · Applied Mathematics and Optimization · OSTI ID:21242048

Error bounds for MEG and EEG source localization
Conference · Tue Dec 31 23:00:00 EST 1991 · OSTI ID:6855257

Error bounds for MEG and EEG source localization
Conference · Mon Nov 30 23:00:00 EST 1992 · OSTI ID:10106595