X-ray absorption and reflection as probes of the GaN conduction bands: Theory and experiment of the N K-edge and Ga M{sub 2,3} edges

Book · Wed Dec 31 00:00:00 EST 1997

OSTI ID:585845

Lambrecht, W R.L.; Rashkeev, S N; Segall, B ^[1]; Lawniczak-Jablonska, K; Suski, T; Gullikson, E M; Underwood, J H; Perera, R C.C. ^[2]; Rife, J C ^[3]

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1. Case Western Reserve Univ., Cleveland, OH (United States). Dept. of Physics
2. Lawrence Berkeley National Lab., CA (United States)
3. Naval Research Lab., Washington, DC (United States)

X-ray absorption and glancing angle reflectivity measurements in the energy range of the Nitrogen K-edge and Gallium M{sub 2,3} edges are reported. Linear muffin-tin orbital band-structure and spectral function calculations are used to interpret the data. Polarization effects are evidenced for the N-K-edge spectra by comparing X-ray reflectivity in s- and p-polarized light.

• Sponsoring Organization: National Science Foundation, Washington, DC (United States); USDOE, Washington, DC (United States)
• OSTI ID: 585845
• Report Number(s): CONF-961202-; ISBN 1-55899-353-3; TRN: IM9810%%62
• Resource Relation: Conference: 1996 Fall meeting of the Materials Research Society (MRS), Boston, MA (United States), 2-6 Dec 1996; Other Information: PBD: 1997; Related Information: Is Part Of III-V nitrides; Ponce, F.A. [ed.] [Xerox Palo Alto Research Center, CA (United States)]; Moustakas, T.D. [ed.] [Boston Univ., MA (United States)]; Akasaki, I. [ed.] [Meijo Univ., Nagoya (Japan)]; Monemar, B.A. [ed.] [Linkoeping Univ. (Sweden)]; PB: 1278 p.; Materials Research Society symposium proceedings, Volume 449
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
GALLIUM NITRIDES
ELECTRONIC STRUCTURE
EXPERIMENTAL DATA
X-RAY SPECTRA
COMPARATIVE EVALUATIONS