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Mechanisms for power deposition in Ar/SiH/sub 4/ capacitively coupled RF discharges

Journal Article · · IEEE Trans. Plasma Sci.; (United States)
OSTI ID:5850626
In low-pressure capacitively coupled parallel-plate radio-frequency (RF) discharges, such as those used in plasma processing of semiconductor materials, power deposition and the rate of electron-impact excitation collisions depend upon time during the RF cycle and position in the discharge. Power is coupled into the discharge in at least two ways: by way of a high-energy ''e-beam'' component of the electron distribution resulting from electrons falling through or being accelerated by the oscillating sheaths, and by ''joule heating'' in the body of plasma. This paper discusses the method of power deposition by electrons and the spatial dependence of electron-impact excitation rates in low-pressure capacitively coupled RF discharges with results from a Monte Carlo plasma simulation code. Mixtures of argon and silane are examined as typical examples of discharges used for the plasma deposition of amorphous silicon.
Research Organization:
Spectra Technology, Inc., Bellevue, WA 98004
OSTI ID:
5850626
Journal Information:
IEEE Trans. Plasma Sci.; (United States), Journal Name: IEEE Trans. Plasma Sci.; (United States) Vol. PS-14:2; ISSN ITPSB
Country of Publication:
United States
Language:
English