Permeability measurement of soft magnetic films at high frequency and multilayering effect

Journal Article · Sun Feb 28 23:00:00 EST 1993 · IEEE Translation Journal on Magnetics in Japan (Institute of Electrical and Electronics Engineers); (United States)

DOI:https://doi.org/10.1109/TJMJ.1993.4565597· OSTI ID:5849095

Senda, M

This paper reports a new method for the measurement of permeability at high frequencies (1 MHz to 1 GHz). An inductance line with a magnetic/conductive/magnetic layer structure was used to estimate the permeability. The inductance line made it possible to measure frequency characteristics of the permeability up to the GHz range because of a low stray capacitance and high resonance frequency. The magnetic film pattern was designed so as to eliminate demagnetizing field effects, and the permeability was estimated based on analysis of the magnetic circuit. Using this method, NiFe/SiO[sub 2] and (Fe/SiO[sub 2])/SiO[sub 2] multilayer films were confirmed to show superior frequency characteristics by a factor of 20 over those of NiFe single-layer film. Also, ferromagnetic resonance (FMR) was observed in these multilayer films at 650 and 750 MHz.

• OSTI ID: 5849095
• Journal Information: IEEE Translation Journal on Magnetics in Japan (Institute of Electrical and Electronics Engineers); (United States), Journal Name: IEEE Translation Journal on Magnetics in Japan (Institute of Electrical and Electronics Engineers); (United States) Vol. 8:3; ISSN ITJJER; ISSN 0882-4959
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
360606* -- Other Materials-- Physical Properties-- (1992-)
ALLOYS
CHALCOGENIDES
COMPOSITE MATERIALS
DATA
EXPERIMENTAL DATA
FERROMAGNETIC RESONANCE
FILMS
INFORMATION
IRON ALLOYS
LAYERS
MAGNETIC CIRCUITS
MAGNETIC MATERIALS
MAGNETIC PROPERTIES
MAGNETIC RESONANCE
MAGNETIC SUSCEPTIBILITY
MATERIALS
NICKEL ALLOYS
NUMERICAL DATA
OXIDES
OXYGEN COMPOUNDS
PHYSICAL PROPERTIES
RESONANCE
SILICON COMPOUNDS
SILICON OXIDES