Neutron irradiation effects on PZT thin films for nonvolatile memory applications

Conference · Sun Dec 01 04:00:00 EST 1991 · IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States)

OSTI ID:5845158

Moore, R A; Benedetto, J M; McGarrity, J M; McLean, F B ^[1]

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1. Harry Diamond Labs., Adelphi, MD (United States)

This paper examines the effects of neutron irradiation on ferroelectric (FE) lead-zirconate-titanate (PZT) thin films. The data show only a slight loss in the FE switched charge, as measured by the hysteresis loop, up to 1 {times} 10{sup 15} n/cm{sup 2}. The retained polarization, as measured by a pulse technique, showed a larger loss of remnant polarization which saturated at the lowest fluence measured (1 {times} 10{sup 13} n/cm{sup 2}). However, in neither case does it appear that the film was degraded sufficiently to cause devices made from sol-gel PZT to fail at fluences at or below 1 {times} 10{sup 15} n/cm{sup 2}. The endurance characteristics of the film were unchanged due to neutron irradiation.

• OSTI ID: 5845158
• Report Number(s): CONF-910751--
• Conference Information: Journal Name: IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States) Journal Volume: 38:6
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
360204 -- Ceramics
Cermets
& Refractories-- Physical Properties
360206* -- Ceramics
Cermets
& Refractories-- Radiation Effects
42 ENGINEERING
426000 -- Engineering-- Components
Electron Devices & Circuits-- (1990-)
BARYONS
ELECTRICAL PROPERTIES
ELEMENTARY PARTICLES
FERMIONS
FERROELECTRIC MATERIALS
FILMS
HADRONS
HYSTERESIS
LEAD COMPOUNDS
MEMORY DEVICES
NEUTRONS
NUCLEONS
OXYGEN COMPOUNDS
PHYSICAL PROPERTIES
POLARIZABILITY
PULSE TECHNIQUES
PZT
RADIATION EFFECTS
SATURATION
SOL-GEL PROCESS
THIN FILMS
TITANATES
TITANIUM COMPOUNDS
TRANSITION ELEMENT COMPOUNDS
USES
VOLATILITY
ZIRCONATES
ZIRCONIUM COMPOUNDS