Neutron irradiation effects on PZT thin films for nonvolatile memory applications
- Harry Diamond Labs., Adelphi, MD (United States)
This paper examines the effects of neutron irradiation on ferroelectric (FE) lead-zirconate-titanate (PZT) thin films. The data show only a slight loss in the FE switched charge, as measured by the hysteresis loop, up to 1 {times} 10{sup 15} n/cm{sup 2}. The retained polarization, as measured by a pulse technique, showed a larger loss of remnant polarization which saturated at the lowest fluence measured (1 {times} 10{sup 13} n/cm{sup 2}). However, in neither case does it appear that the film was degraded sufficiently to cause devices made from sol-gel PZT to fail at fluences at or below 1 {times} 10{sup 15} n/cm{sup 2}. The endurance characteristics of the film were unchanged due to neutron irradiation.
- OSTI ID:
- 5845158
- Report Number(s):
- CONF-910751--
- Journal Information:
- IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States), Journal Name: IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States) Vol. 38:6; ISSN 0018-9499; ISSN IETNA
- Country of Publication:
- United States
- Language:
- English
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360206* -- Ceramics
Cermets
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42 ENGINEERING
426000 -- Engineering-- Components
Electron Devices & Circuits-- (1990-)
BARYONS
ELECTRICAL PROPERTIES
ELEMENTARY PARTICLES
FERMIONS
FERROELECTRIC MATERIALS
FILMS
HADRONS
HYSTERESIS
LEAD COMPOUNDS
MEMORY DEVICES
NEUTRONS
NUCLEONS
OXYGEN COMPOUNDS
PHYSICAL PROPERTIES
POLARIZABILITY
PULSE TECHNIQUES
PZT
RADIATION EFFECTS
SATURATION
SOL-GEL PROCESS
THIN FILMS
TITANATES
TITANIUM COMPOUNDS
TRANSITION ELEMENT COMPOUNDS
USES
VOLATILITY
ZIRCONATES
ZIRCONIUM COMPOUNDS