The elastic, plastic, and time dependent properties of thin films as determined by ultra low load indentation

Conference · Tue Jan 01 04:00:00 EST 1991

OSTI ID:5833193

Lucas, B N; Oliver, W C

Using a highly spatially resolved mechanical properties microprobe, the elastic, plastic and time dependent mechanical properties of sapphire and a 1.9 {mu}m amorphous alumina film on a sapphire substrate have been studied. Young's modulus, hardness, and stress-exponent data are reported. The technique for characterizing time dependent properties via indentation (hardness versus displacement rate/displacement) are directly compared to standard uniaxial compressive techniques (stress vs strain rate) for a bulk Pb-In alloy to further quantify the relationships between the two techniques.

• Research Organization: Oak Ridge National Lab., TN (United States)
• Sponsoring Organization: DOE; USDOE, Washington, DC (United States)
• DOE Contract Number: AC05-84OR21400
• OSTI ID: 5833193
• Report Number(s): CONF-911202-58; ON: DE92007700
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
360103 -- Metals & Alloys-- Mechanical Properties
360203* -- Ceramics
Cermets
& Refractories-- Mechanical Properties
ALLOYS
ALUMINIUM COMPOUNDS
ALUMINIUM OXIDES
CHALCOGENIDES
CORUNDUM
CREEP
FILMS
HARDNESS
INDIUM ALLOYS
LEAD ALLOYS
LEAD BASE ALLOYS
MECHANICAL PROPERTIES
MINERALS
OXIDE MINERALS
OXIDES
OXYGEN COMPOUNDS
SAPPHIRE
THIN FILMS
TIME DEPENDENCE
YOUNG MODULUS