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The Elastic, Plastic, and Time Dependent Properties of thin Films as Determined by Ultra low Load Indentation

Conference · · MRS Online Proceedings Library
DOI:https://doi.org/10.1557/PROC-239-337· OSTI ID:10121785
 [1];  [1]
  1. Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)
Using a highly spatially resolved mechanical properties microprobe, the elastic, plastic and time dependent mechanical properties of sapphire and a 1.9 μm amorphous alumina film on a sapphire substrate have been studied. Young's modulus, hardness, and stress-exponent data are reported. The technique for characterizing time dependent properties via indentation (hardness versus displacement rate/displacement) are directly compared to standard uniaxial compressive techniques (stress vs strain rate) for a bulk Pb-In alloy to further quantify the relationships between the two techniques.
Research Organization:
Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)
Sponsoring Organization:
USDOE Office of Science (SC), Basic Energy Sciences (BES). Materials Sciences & Engineering Division (MSE)
DOE Contract Number:
AC05-84OR21400
OSTI ID:
10121785
Report Number(s):
CONF-911202--58; ON: DE92007700
Resource Type:
Conference paper/presentation
Conference Information:
Journal Name: MRS Online Proceedings Library Journal Volume: 239
Country of Publication:
United States
Language:
English

References (5)

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