The Elastic, Plastic, and Time Dependent Properties of thin Films as Determined by Ultra low Load Indentation
Conference
·
· MRS Online Proceedings Library
- Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)
Using a highly spatially resolved mechanical properties microprobe, the elastic, plastic and time dependent mechanical properties of sapphire and a 1.9 μm amorphous alumina film on a sapphire substrate have been studied. Young's modulus, hardness, and stress-exponent data are reported. The technique for characterizing time dependent properties via indentation (hardness versus displacement rate/displacement) are directly compared to standard uniaxial compressive techniques (stress vs strain rate) for a bulk Pb-In alloy to further quantify the relationships between the two techniques.
- Research Organization:
- Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)
- Sponsoring Organization:
- USDOE Office of Science (SC), Basic Energy Sciences (BES). Materials Sciences & Engineering Division (MSE)
- DOE Contract Number:
- AC05-84OR21400
- OSTI ID:
- 10121785
- Report Number(s):
- CONF-911202--58; ON: DE92007700
- Resource Type:
- Conference paper/presentation
- Conference Information:
- Journal Name: MRS Online Proceedings Library Journal Volume: 239
- Country of Publication:
- United States
- Language:
- English
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