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The role of secondary electron collection in box IEMP coupling

Journal Article · · IEEE Trans. Nucl. Sci.; (United States)

Analytical models have been developed to estimate the secondary electron current collected at a biased land during box IEMP. The simple models are intended for the use of systems designers who must estimate the threat to active electronics during box IEMP and who may not have access to the large computer codes which simulate SGEMP. Separate theories apply to the nonself-consistent regime (when the collected charge does not greatly perturb the cavity fields) and the spacecharge-limited regime (when the secondary electrons screen the potential near the land). Analytical calculations for simple test cases compare well with selfconsistent SGEMP computer simulations and with data from past experiments at an MBS facility. Underprediction of the response at biases above +100 V suggests that an undetermined physical mechanism becomes important at high biases.

Research Organization:
JAYCOR, P.O. Box 85154, San Diego, CA 92138
OSTI ID:
5832895
Journal Information:
IEEE Trans. Nucl. Sci.; (United States), Journal Name: IEEE Trans. Nucl. Sci.; (United States) Vol. NS-31:6; ISSN IETNA
Country of Publication:
United States
Language:
English