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Space radiation effects in InP solar cells

Conference · · IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States)
OSTI ID:5832447
;  [1];  [2]; ;  [3]
  1. Naval Research Lab., Washington, DC (United States)
  2. SFA, Inc., Landover, MD (US)
  3. Spire Corp., Bedford, MA (United States)

This paper reports InP solar cells and mesa diodes grown by metalorganic chemical vapor deposition (MOCVD) have been irradiated with electrons and protons at room temperature. The radiation induced defects (RID's) were characterized by Deep Level Transient Spectroscopy (DLTS), and the degradation of the solar cell performance was determined through I-V measurements. The nonionizing energy loss (NIEL) of electrons and protons in InP was calculated as a function of energy from 1-200 MeV and compared to the measured defect introduction rates. A linear dependence was evident. InP solar cells showed significantly more radiation resistance than c-Si or GaAs/Ge cells under 1 MeV electron irradiation. Using the calculated InP damage rates and measured damage factors, the performance of InP solar cells as a function of orbital altitude and time in orbit was predicted and compared with the performance of c-Si solar cells in the same environment. In all cases, the InP cells showed highly superior radiation resistance.

OSTI ID:
5832447
Report Number(s):
CONF-910751--
Journal Information:
IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States), Journal Name: IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States) Vol. 38:6; ISSN 0018-9499; ISSN IETNA
Country of Publication:
United States
Language:
English

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