Modal reflection of quarter-wave mirrors in vertical cavity lasers
Journal Article
·
· IEEE Journal of Quantum Electronics (Institute of Electrical and Electronics Engineers); (United States)
- Univ. of California, Santa Barbara, CA (United States)
The cavities of vertical semiconductor lasers have lengths of the order of a few wavelengths and typically involve quarter-wave mirror or bulk sections with no lateral guiding. Very high plane wave reflection coefficients can be obtained with practical semiconductor quarter-wave mirrors, but for beams of finite width, the reflection coefficient of a mirror with no lateral guiding and hence the finesse of cavities that use such structures will be limited by diffraction loss. The analytically and numerically study the modal reflection of practical semiconductor quarter-wave mirrors. They introduce a quantity called the diffraction range of a quarter-wave mirror as a means of exact analytical comparison between infinite lossless mirrors (and approximate comparison for finite mirrors) in the Fresnel diffraction limit. The exact modal reflection coefficient for an arbitrary incident mode pattern is determined by vector plane wave decomposition. They study the modal reflection coefficients of two representative semiconductor quarter-wave mirrors used in vertical-cavity laser technology: AlAs/GaAs and InGaAsP/InP.
- OSTI ID:
- 5826381
- Journal Information:
- IEEE Journal of Quantum Electronics (Institute of Electrical and Electronics Engineers); (United States), Journal Name: IEEE Journal of Quantum Electronics (Institute of Electrical and Electronics Engineers); (United States) Vol. 29:6; ISSN 0018-9197; ISSN IEJQA7
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
42 ENGINEERING
426002* -- Engineering-- Lasers & Masers-- (1990-)
ANALYTICAL SOLUTION
DATA
INFORMATION
LASER CAVITIES
LASER MIRRORS
LASERS
MIRRORS
NUMERICAL DATA
NUMERICAL SOLUTION
OPTICAL PROPERTIES
PHYSICAL PROPERTIES
REFLECTION
REFLECTIVITY
SEMICONDUCTOR DEVICES
SEMICONDUCTOR LASERS
SOLID STATE LASERS
SURFACE PROPERTIES
THEORETICAL DATA
426002* -- Engineering-- Lasers & Masers-- (1990-)
ANALYTICAL SOLUTION
DATA
INFORMATION
LASER CAVITIES
LASER MIRRORS
LASERS
MIRRORS
NUMERICAL DATA
NUMERICAL SOLUTION
OPTICAL PROPERTIES
PHYSICAL PROPERTIES
REFLECTION
REFLECTIVITY
SEMICONDUCTOR DEVICES
SEMICONDUCTOR LASERS
SOLID STATE LASERS
SURFACE PROPERTIES
THEORETICAL DATA