Trace surface analysis using ion and photon desorption with resonance ionization detection
Conference
·
OSTI ID:5818340
- Argonne National Lab., IL (USA)
- Chicago Univ., IL (USA). Enrico Fermi Inst.
Surface Analysis by Resonant Ionization of Sputtered Atoms (SARISA) has demonstrated the ability to detect trace elements at concentrations below 100 ppt. Use of energetic primary ions to desorb surface species is uniquely suited for elemental surface analysis because the ratio between the number of incident energetic ions and the number of ejected surface atoms is easily quantifiable as the sputter yield. Molecular surface analysis by ion desorption does not possess this advantage, however. In this case, laser desorption followed by resonant or near resonant ionization is often a better analysis tool. Here the power of resonant ionization detection of desorbed species is demonstrated on hibonite samples (for elemental analysis) and on fullerene samples (for molecular analysis). 10 refs., 1 fig., 1 tab.
- Research Organization:
- Argonne National Lab., IL (USA)
- Sponsoring Organization:
- DOE; USDOE, Washington, DC (USA)
- DOE Contract Number:
- W-31109-ENG-38
- OSTI ID:
- 5818340
- Report Number(s):
- ANL/CP-71308; CONF-9104192--2; ON: DE91011171
- Country of Publication:
- United States
- Language:
- English
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