Trace analysis of osmium and rhenium by resonance ionization mass spectrometry of sputtered atoms
Conference
·
OSTI ID:5219353
- Argonne National Lab., IL (USA)
The quantitative trace analysis of Os and Re was investigated using the surface analysis by resonance ionization of sputtered atoms (SARISA) apparatus developed at Argonne National Laboratory. SARISA samples the large fraction of sputtered neutral atoms and utilizes multiphoton resonance ionization to suppress atomic and molecular interferences. Matrix effects are considerably reduced for high ionization occurs in the gas phase and is independent of the physical properties of the substrate. Synthetic metal standards and iron meteorites of known bulk Os concentration were used to establish a calibration curve for Os to test the linearity of the Os{sup +} signal over a large range in concentration. 7 refs., 1 fig.
- Research Organization:
- Argonne National Lab., IL (USA)
- Sponsoring Organization:
- DOE/ER
- DOE Contract Number:
- W-31109-ENG-38
- OSTI ID:
- 5219353
- Report Number(s):
- CONF-8909172-4; ON: DE90003767
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
640302* -- Atomic
Molecular & Chemical Physics-- Atomic & Molecular Properties & Theory
74 ATOMIC AND MOLECULAR PHYSICS
ELEMENTS
IONIZATION
MASS SPECTROSCOPY
METALS
MULTI-PHOTON PROCESSES
OSMIUM
PHOTOIONIZATION
PLATINUM METALS
RESONANCE IONIZATION MASS SPECTROSCOPY
RHENIUM
SPECTROSCOPY
SPUTTERING
TRANSITION ELEMENTS
Molecular & Chemical Physics-- Atomic & Molecular Properties & Theory
74 ATOMIC AND MOLECULAR PHYSICS
ELEMENTS
IONIZATION
MASS SPECTROSCOPY
METALS
MULTI-PHOTON PROCESSES
OSMIUM
PHOTOIONIZATION
PLATINUM METALS
RESONANCE IONIZATION MASS SPECTROSCOPY
RHENIUM
SPECTROSCOPY
SPUTTERING
TRANSITION ELEMENTS