Dependence of the polar Kerr angle and coercivity on repeat distance in sequentially prepared Tb/FeCo films
- Mass Memory Division-Research Laboratories, Eastman Kodak Company, Rochester, New York 14650-2002 (US)
Multilayer thin films of Tb and FeCo were prepared by sequential thermal evaporation of Tb and Fe{sub 90}Co{sub 10} alloy on glass substrates at ambient temperature in a vacuum of about 1 {times} 10{sup {minus}6} Torr. The repeat distance of the films was varied from 3.5 to 175 A while maintaining the composition constant for all samples. Low-angle x-ray diffraction and Auger electron spectroscopy showed that a multilayer structure was achieved for films fabricated with a repeat distance {Lambda}{ge}31.5 A. The polar Kerr rotation angle and coercivity of the samples were obtained by measuring the polar Kerr hysteresis loop using a 632.8-nm HeNe laser. It was observed that for the samples having a multilayer structure, the remnant Kerr angle and coercivity monotonically decreased with increasing repeat distance, and eventually disappeared for {Lambda}{ge}70 A. For the samples showing a nonmultilayer structure, the remnant Kerr angle was independent of repeat distance. However, the coercivity increased with repeat distance until a broad maximum was obtained around {Lambda}{congruent}14--21 A.
- OSTI ID:
- 5813876
- Journal Information:
- Journal of Applied Physics; (USA), Vol. 69:8; ISSN 0021-8979
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
COBALT ALLOYS
MAGNETIC PROPERTIES
IRON ALLOYS
TERBIUM
AUGER ELECTRON SPECTROSCOPY
COERCIVE FORCE
GLASS
KERR EFFECT
SUBSTRATES
THIN FILMS
VAPOR DEPOSITED COATINGS
X-RAY DIFFRACTION
ALLOYS
COATINGS
COHERENT SCATTERING
DIELECTRIC PROPERTIES
DIFFRACTION
ELECTRICAL PROPERTIES
ELECTRON SPECTROSCOPY
ELEMENTS
FILMS
METALS
PHYSICAL PROPERTIES
RARE EARTHS
SCATTERING
SPECTROSCOPY
360104* - Metals & Alloys- Physical Properties