Microwave and ion beam studies of an applied B sub. theta. diode

Journal Article · Tue Sep 01 04:00:00 EDT 1987 · Journal of Applied Physics; (United States)

DOI:https://doi.org/10.1063/1.339589· OSTI ID:5805040

Renk, T J; Hammer, D A ^[1]

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1. Laboratory of Plasma Studies, Cornell University, Ithaca, New York 14853

A parametric study of microwave radiation emitted from an ''applied B{sub {theta}}'' magnetically insulated ion diode, covering frequencies between 0.3 and 85 GHz, indicates that collective mechanisms are responsible for the 1--10-MW peak output. These collective mechanisms may also be related to the degradation in ion beam quality seen by a scintillator/streak camera diagnostic. This degradation is most apparent when the microwave flux is at its maximum. A deformation of the plasma appears to be the most likely cause of the disturbances seen in the ion beam.

• OSTI ID: 5805040
• Journal Information: Journal of Applied Physics; (United States), Journal Name: Journal of Applied Physics; (United States) Vol. 62:5; ISSN 0021-8979; ISSN JAPIA
• Country of Publication: United States
• Language: ENGLISH

Related Subjects

70 PLASMA PHYSICS AND FUSION TECHNOLOGY
700208* -- Fusion Power Plant Technology-- Inertial Confinement Technology
IMPACT FUSION DRIVERS
INERTIAL CONFINEMENT
ION BEAMS
ION SOURCES
MICROWAVE EQUIPMENT
MICROWAVE RADIATION
MICROWAVE SPECTRA
PLASMA DIAGNOSTICS
POWER RANGE 1-10 MW
STREAK CAMERAS