Metal-nitride-oxide-semiconductor detector for an ionizing radiation dosimeter. Final report
Technical Report
·
OSTI ID:5802112
A method of radiation dosimetry using a Metal-Nitride-Oxide-Semiconductor (MNOS) device as the detector was developed and partially evaluated. The MNOS devices are capable of measuring doses from 10 krds to 4 Mrds. Repeatability of observations indicates a precision of 1 percent of total dose from 200 krds to 4 Mrds (Si). Dosage in rads (rds) is obtained by reference to a calibrated source exposure rate and not to dose absorbed within the dosimeter. A Co 60 source was used for all radiation testing. Schematics are given for some of the circuits tested. Determination of dosage from the system is indirect and requires the use of a calibration curve. Each dosimeter must be calibrated from a known source. Direct readout of dose is suggested by use of a microprocessor. Exposure to 2 x 10 to the 7th power rds did not degrade performance. Devices eventually failed due to charge migration from the large integrated circuit chip on which they were fabricated. Discrete, nonstepped gate MNOS transistors are recommended.
- Research Organization:
- Air Force Weapons Lab., Kirtland AFB, NM (USA)
- OSTI ID:
- 5802112
- Report Number(s):
- AD-A-065995
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
440102* -- Radiation Instrumentation-- Radiation Dosemeters
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
CALIBRATION
DOSIMETRY
ELECTRONIC CIRCUITS
FEASIBILITY STUDIES
GAMMA DOSIMETRY
INTEGRATED CIRCUITS
MEASURING INSTRUMENTS
MICROELECTRONIC CIRCUITS
MICROPROCESSORS
PERFORMANCE
RADIATION DETECTORS
SEMICONDUCTOR DETECTORS
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
CALIBRATION
DOSIMETRY
ELECTRONIC CIRCUITS
FEASIBILITY STUDIES
GAMMA DOSIMETRY
INTEGRATED CIRCUITS
MEASURING INSTRUMENTS
MICROELECTRONIC CIRCUITS
MICROPROCESSORS
PERFORMANCE
RADIATION DETECTORS
SEMICONDUCTOR DETECTORS