Ion backscattering from layered targets

Journal Article · Thu Mar 01 04:00:00 EST 1984 · AIP Conf. Proc.; (United States)

DOI:https://doi.org/10.1063/1.34417· OSTI ID:5798347

Oen, O S; Robinson, M T

The reflection of H atoms from amorphous layered targets were studied using a new version of the computer simulation code MARLOWE. Targets with low Z overlayers on high Z substrates, and vice versa, were investigated using normally incident atoms in the energy range from 0.01 to 1 keV. For very low energies, the backscattering is characteristic of the surface overlayer; at higher energies, which depend on the overlayer thickness, it becomes characteristic of the underlying substrate. In addition to the particle and energy reflection coefficients, the reflected atom energy distribution and the correlation between the emergent energy and angle have been examined.

• Research Organization: Solid State Division, Oak Ridge National Laboratory, Oak Ridge, TN 37830
• DOE Contract Number: W-7405-ENG-26
• OSTI ID: 5798347
• Report Number(s): CONF-831180-
• Journal Information: AIP Conf. Proc.; (United States), Journal Name: AIP Conf. Proc.; (United States) Vol. 111:1; ISSN APCPC
• Country of Publication: United States
• Language: English

Related Subjects

640301* -- Atomic
Molecular & Chemical Physics-- Beams & their Reactions
71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
ALKALI METALS
ALUMINIUM
AMORPHOUS STATE
ARGON
ATOM COLLISIONS
BACKSCATTERING
COLLISIONS
COMPUTER CODES
COMPUTERIZED SIMULATION
DATA
ELEMENTS
ENERGY DEPENDENCE
ENERGY RANGE
EV RANGE
EV RANGE 100-1000
EXPERIMENTAL DATA
FLUIDS
GASES
HYDROGEN
INCIDENCE ANGLE
INFORMATION
KEV RANGE
KEV RANGE 01-10
LITHIUM
METALS
NICKEL
NONMETALS
NUMERICAL DATA
RARE GASES
SCATTERING
SIMULATION
SUBSTRATES
TARGETS
TRANSITION ELEMENTS
TUNGSTEN