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High-resolution scanning transmission electron microscopy

Journal Article · · Science (Washington, D.C.); (United States)
The article provides a general overview of the instrumentation, a discussion of its probe-forming system and its detection system. 8 figures.
Research Organization:
Univ. of Chicago, IL
OSTI ID:
5780647
Journal Information:
Science (Washington, D.C.); (United States), Journal Name: Science (Washington, D.C.); (United States) Vol. 221:4608; ISSN SCIEA
Country of Publication:
United States
Language:
English

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Related Subjects

37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY
400104* -- Spectral Procedures-- (-1987)
440300 -- Miscellaneous Instruments-- (-1989)
47 OTHER INSTRUMENTATION
645000 -- High Energy Physics
651000 -- Nuclear Physics
72 PHYSICS OF ELEMENTARY PARTICLES AND FIELDS
73 NUCLEAR PHYSICS AND RADIATION PHYSICS
CHARGED PARTICLE DETECTION
DESIGN
DETECTION
DOCUMENT TYPES
ELECTRON DETECTION
ELECTRON MICROSCOPY
ELECTRON PROBES
MICROSCOPY
OPERATION
PROBES
RADIATION DETECTION
REVIEWS
SCANNING ELECTRON MICROSCOPY
TRANSMISSION ELECTRON MICROSCOPY