Modelling atomic resolution scanning transmission electron microscopy images

Journal Article · Tue Jan 01 04:00:00 EST 2008 · Microscopy and Microanalysis

DOI:https://doi.org/10.1017/S1431927608080112· OSTI ID:988199

Findlay, Scott D. ^[1]; Oxley, Mark P ^[2]; Allen, L. J. ^[1]

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1. University of Melbourne, Australia
2. ORNL

A real-space description of inelastic scattering in scanning transmission electron microscopy is derived with particular attention given to the implementation of the projected potential approximation. A hierarchy of approximations to expressions for inelastic images is presented. Emphasis is placed on the conditions that must hold in each case. The expressions that justify the most direct, visual interpretation of experimental data are also the most approximate. Therefore, caution must be exercised in selecting experimental parameters that validate the approximations needed for the analysis technique used. To make the most direct, visual interpretation of electron-energy-loss spectroscopic images from core-shell excitations requires detector improvements commensurate with those that aberration correction provides for the probe-forming lens. Such conditions can be relaxed when detailed simulations are performed as part of the analysis of experimental data.

• Research Organization: Oak Ridge National Laboratory (ORNL)
• Sponsoring Organization: SC USDOE - Office of Science (SC)
• DOE Contract Number: AC05-00OR22725
• OSTI ID: 988199
• Journal Information: Microscopy and Microanalysis, Journal Name: Microscopy and Microanalysis Journal Issue: 1 Vol. 14; ISSN 1431-9276; ISSN MIMIF7
• Country of Publication: United States
• Language: English

Related Subjects

37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY
DATA ANALYSIS
ENERGY-LOSS SPECTROSCOPY
IMAGES
INELASTIC SCATTERING
MATHEMATICAL MODELS
RESOLUTION
SCANNING ELECTRON MICROSCOPY
TRANSMISSION ELECTRON MICROSCOPY