Destabilization of zirconia thermal barriers in the presence of V/sub 2/O/sub 5/

Journal Article · Tue Nov 01 04:00:00 EST 1988 · J. Am. Ceram. Soc.; (United States)

DOI:https://doi.org/10.1111/j.1151-2916.1988.tb07570.x· OSTI ID:5777736

Susnitzky, D W; Carter, C B; Hertl, W

Impurities, such as vanadium, degrade the operating performance of yttria-stabilized zirconia thermal-barrier coatings. V/sub 2/O/sub 5/ reacts preferentially with Y/sub 2/O/sub 3/, forms YVO/sub 4/, and leads to the destabilization of zirconia thermal-barrier material. A model experiment has been designed to monitor the destabilization of zirconia thermal barriers by directly exposing thin films of yttria-stabilized zirconia to V/sub 2/O/sub 5/ vapor. The growth of YVO/sub 4/ from yttria-stabilized zirconia and the destabilization of cubic yttria-stabilized zirconia into tetragonal and/or monoclinic zirconia polymorphs are monitored by selected-area diffraction and energy-dispersive X-ray spectroscopy in the transmission electron microscope. A special crystallographic orientation relation between YVO/sub 4/ and cubic zirconia is discussed.

• Research Organization: Cornell Univ., Ithaca, NY (USA). Dept. of Materials Science and Engineering; De La Salle Univ., Manila (Philippines)
• OSTI ID: 5777736
• Journal Information: J. Am. Ceram. Soc.; (United States), Journal Name: J. Am. Ceram. Soc.; (United States) Vol. 71:11; ISSN JACTA
• Country of Publication: United States
• Language: English

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75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
CHALCOGENIDES
CHEMICAL REACTION KINETICS
CRYSTAL GROWTH METHODS
CRYSTAL LATTICES
CRYSTAL STRUCTURE
CRYSTALLOGRAPHY
DATA
ELECTRON MICROSCOPY
EXPERIMENTAL DATA
FILMS
GRAIN ORIENTATION
IMPURITIES
INFORMATION
KINETICS
MICROSCOPY
MICROSTRUCTURE
NUMERICAL DATA
ORIENTATION
OXIDES
OXYGEN COMPOUNDS
REACTION KINETICS
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TRANSITION ELEMENT COMPOUNDS
TRANSMISSION ELECTRON MICROSCOPY
VANADIUM COMPOUNDS
VANADIUM OXIDES
X-RAY SPECTRA
YTTRIUM COMPOUNDS
YTTRIUM OXIDES
ZIRCONIUM COMPOUNDS
ZIRCONIUM OXIDES