Destabilization of zirconia thermal barriers in the presence of V/sub 2/O/sub 5/

Journal Article · Mon Oct 31 23:00:00 EST 1988 · J. Am. Ceram. Soc.; (United States)

DOI:https://doi.org/10.1111/j.1151-2916.1988.tb07570.x· OSTI ID:5777736

Susnitzky, D W; Carter, C B; Hertl, W

Impurities, such as vanadium, degrade the operating performance of yttria-stabilized zirconia thermal-barrier coatings. V/sub 2/O/sub 5/ reacts preferentially with Y/sub 2/O/sub 3/, forms YVO/sub 4/, and leads to the destabilization of zirconia thermal-barrier material. A model experiment has been designed to monitor the destabilization of zirconia thermal barriers by directly exposing thin films of yttria-stabilized zirconia to V/sub 2/O/sub 5/ vapor. The growth of YVO/sub 4/ from yttria-stabilized zirconia and the destabilization of cubic yttria-stabilized zirconia into tetragonal and/or monoclinic zirconia polymorphs are monitored by selected-area diffraction and energy-dispersive X-ray spectroscopy in the transmission electron microscope. A special crystallographic orientation relation between YVO/sub 4/ and cubic zirconia is discussed.

• Research Organization: Cornell Univ., Ithaca, NY (USA). Dept. of Materials Science and Engineering; De La Salle Univ., Manila (Philippines)
• OSTI ID: 5777736
• Journal Information: J. Am. Ceram. Soc.; (United States), Journal Name: J. Am. Ceram. Soc.; (United States) Vol. 71:11; ISSN JACTA
• Country of Publication: United States
• Language: English

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75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
CHALCOGENIDES
CHEMICAL REACTION KINETICS
CRYSTAL GROWTH METHODS
CRYSTAL LATTICES
CRYSTAL STRUCTURE
CRYSTALLOGRAPHY
DATA
ELECTRON MICROSCOPY
EXPERIMENTAL DATA
FILMS
GRAIN ORIENTATION
IMPURITIES
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MICROSCOPY
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NUMERICAL DATA
ORIENTATION
OXIDES
OXYGEN COMPOUNDS
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TRANSITION ELEMENT COMPOUNDS
TRANSMISSION ELECTRON MICROSCOPY
VANADIUM COMPOUNDS
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X-RAY SPECTRA
YTTRIUM COMPOUNDS
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ZIRCONIUM COMPOUNDS
ZIRCONIUM OXIDES