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Choice between FETs or bipolar transistors and optimization of their working points in low noise preamplifiers for fast pulse processing. Theory and experimental results

Journal Article · · IEEE Trans. Nucl. Sci.; (United States)
Theoretical and experimental investigation has been carried out to determine the best working conditions of single or parallel combinations of field-effect or bipolar transistors in low noise preamplifiers for processing times in the 10 ns range. The effects of diffusion capacitance and base spreading resistance in bipolar transistors have been put into evidence and a way of reducing the noise due to the latter is suggested and experimentally demonstrated.
Research Organization:
Institute of Physics, Palitecnico di Milano and INFN Milano
OSTI ID:
5767120
Journal Information:
IEEE Trans. Nucl. Sci.; (United States), Journal Name: IEEE Trans. Nucl. Sci.; (United States) Vol. 30:1; ISSN IETNA
Country of Publication:
United States
Language:
English