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Degradation mechanisms of gamma irradiated LWIR HgCdTe photovoltaic detectors

Conference · · IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (USA)
OSTI ID:5722084
; ;  [1]; ; ;  [2]
  1. Soreq Nuclear Research Center, Yavne 70600 (IL)
  2. SCD-Semiconductor Devices, D.N. Misgav 20179 (IL)
Planar n{sup +}p Hg{sub 1{minus}x}Cd{sub x}Te (x = 0.23) photodiodes passivated with ZnS were irradiated by Co{sup 60} gamma source. A strong increase in the reverse dark current was observed for doses above 0.3 Mrad(air). A similar effect was found by exposing the photodiodes to U.V illumination from a high pressure mercury lamp. By filtering the U.V light it is shown that the degradation in the performance of the photodiodes is caused by the light or radiation absorbed in the ZnS layer above the implanted n-type region. C-V measurements of irradiated MIS devices showed a significant increase in the fast surface state density. Galvanomagnetic and lifetime measurements made on irradiated p-type HgCdTe layer showed no significant changes in the bulk transport parameters. Based on these findings, a model for the degradation mechanism is proposed.
OSTI ID:
5722084
Report Number(s):
CONF-900723--
Conference Information:
Journal Name: IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (USA) Journal Volume: 37:6
Country of Publication:
United States
Language:
English