Characterization of ceramics and glass using proton-induced X-ray emission

Journal Article · Mon Nov 01 04:00:00 EST 1993 · American Ceramic Society Bulletin; (United States)

OSTI ID:5715635

Shackelford, J F; Risbud, S H ^[1]; Kusko, B H; Cahill, T A ^[2]; Bihuniak, P P; Hanson, M E ^[3]

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1. Univ. of California, Davis, CA (United States). Dept. of Chemical Engineering and Materials Science
2. Univ. of California, Davis, CA (United States). Crocker Nuclear Lab
3. PPG Industries, Inc., Pittsburgh, PA (United States). Advanced Research Div.

Proton-induced X-ray emission (PIXE) is one of various chemical analysis tools that uses X-rays to identify individual elements. It is closely related to X-ray fluorescence (XRF) and electron microprobe analysis (EMA). Although XRF and EMA are routinely used by materials engineers, PIXE is relatively uncommon. On the other hand, PIXE has proved to be the preferred technique in several specialized applications in environmental and biological studies. Many of the authors of this paper have recently demonstrated the utility of the technique in analyzing various commercial glass plates with and without transition-metal oxide coatings. The recent development of focused proton beams increases the potential of PIXE for the analysis of engineering materials.

• OSTI ID: 5715635
• Journal Information: American Ceramic Society Bulletin; (United States), Journal Name: American Ceramic Society Bulletin; (United States) Vol. 72:11; ISSN 0002-7812; ISSN ACSBA7
• Country of Publication: United States
• Language: English

Related Subjects

07 ISOTOPE AND RADIATION SOURCES
070204* -- Radiation Sources-- Industrial Uses
Radiometric
BEAMS
CERAMICS
CHEMICAL ANALYSIS
CONTROL
GLASS
NONDESTRUCTIVE ANALYSIS
NUCLEON BEAMS
PARTICLE BEAMS
PIXE ANALYSIS
PROTON BEAMS
QUALITY CONTROL
X-RAY EMISSION ANALYSIS