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Combined XRF and PIXE analysis of flour

Journal Article · · Appl. Phys. Commun.; (United States)
OSTI ID:7076185
Combined X-Ray Fluorescence (XRF) and Proton Induced X-ray Emission (PIXE) techniques were used for the determination of trace and minor elements in two different samples of flour purchased at the local market. The significance of some of the elements found in the samples is discussed from the viewpoint of nutrition. It is also shown that XRF can be a useful complementary technique for PIXE analysis of flour.
Research Organization:
Univ. of Jordan, Amman
OSTI ID:
7076185
Journal Information:
Appl. Phys. Commun.; (United States), Journal Name: Appl. Phys. Commun.; (United States) Vol. 6:2-3; ISSN APCOD
Country of Publication:
United States
Language:
English