Fluctuations in finite-capacitance Josephson tunnel junctions

Journal Article · Mon Jun 01 04:00:00 EDT 1981 · Sov. J. Low Temp. Phys. (Engl. Transl.); (United States)

OSTI ID:5698911

Zorin, A

A general expression is obtained for the spectral density of voltage fluctuations in a Josephson tunnel junction S/sub V/ (..omega..). According to this expression, voltage fluctuations at a frequency ..omega.. can be viewed as resulting from parametric transformation of fluctuation sources at combination frequencies ..omega..+(m+1/2)..omega../sub v/, where ..omega../sub v/ = 2eV is the Josephson frequency. The low-frequency spectral density S/sub V/(0) is computed as a function of the average voltage V-bar for a junction with a relatively low intrinsic capacitance (..beta..<<1). The result of the calculation is compared with the generalized resistive model of a Josephson junction, as well as with the magnitude of S/sub V/(0) for a tunnel junction in the normal state.

• Research Organization: M. V. Lomonosov State University, Moscow
• OSTI ID: 5698911
• Journal Information: Sov. J. Low Temp. Phys. (Engl. Transl.); (United States), Journal Name: Sov. J. Low Temp. Phys. (Engl. Transl.); (United States) Vol. 7:6; ISSN SJLPD
• Country of Publication: United States
• Language: English

Related Subjects

656101* -- Solid State Physics-- Superconductivity-- General Theory-- (-1987)
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
CAPACITANCE
ELECTRIC POTENTIAL
ELECTRICAL PROPERTIES
FLUCTUATIONS
FREQUENCY DEPENDENCE
FUNCTIONS
JOSEPHSON JUNCTIONS
JUNCTIONS
PHYSICAL PROPERTIES
SPECTRAL DENSITY
SPECTRAL FUNCTIONS
SUPERCONDUCTING JUNCTIONS
VARIATIONS