Quantum-noise theory for the resistively shunted Josephson junction

Journal Article · Sun Dec 28 23:00:00 EST 1980 · Phys. Rev. Lett.; (United States)

DOI:https://doi.org/10.1103/PhysRevLett.45.2132· OSTI ID:7050802

Koch, R H; Van Harlingen, D J; Clarke, J

We show that the low-frequency spectral density of the voltage noise in a current-biased Josephson junction with critical current I/sub o/, shunt resistance R, and small capacitance is eI/sub 0//sup ts2/R/sup 3//..pi..V in the limit eV>>k/sub B/T(I/I/sub o/)/sup 2/ and I>I/sub o/, where V is the voltage and I is the current. The noise arises from zero-point current fluctuations in the shunt resistor. The rounding of the current-voltage characteristic caused by the quantum fluctuations and the effects of nonzero junction capacitance are calculated.

• Research Organization: Department of Physics, University of California, Berkeley, California 94720
• DOE Contract Number: W-7405-ENG-48
• OSTI ID: 7050802
• Journal Information: Phys. Rev. Lett.; (United States), Journal Name: Phys. Rev. Lett.; (United States) Vol. 45:26; ISSN PRLTA
• Country of Publication: United States
• Language: English

Related Subjects

420201* -- Engineering-- Cryogenic Equipment & Devices
71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
CRITICAL CURRENT
CURRENTS
ELECTRIC CURRENTS
ELECTRIC POTENTIAL
ELECTRONIC EQUIPMENT
ENERGY GAP
EQUATIONS
EQUIPMENT
FLUCTUATIONS
FLUXMETERS
FUNCTIONS
JOSEPHSON JUNCTIONS
JUNCTIONS
LANGEVIN EQUATION
MEASURING INSTRUMENTS
MICROWAVE EQUIPMENT
QUANTUM ELECTRONICS
SPECTRAL DENSITY
SPECTRAL FUNCTIONS
SQUID DEVICES
SUPERCONDUCTING DEVICES
SUPERCONDUCTING JUNCTIONS
ULTRALOW TEMPERATURE
VARIATIONS